Si cryogenic etch 70 nm holes - NanoLabStaff/nanolab GitHub Wiki
by Vilde Sørdal ([email protected])
-
Chamber clean
Wipe down chamber with cleanroom wipes with isopropanol and DI water. (Ask a NanoLab engineer for this.) It may not be necessary to do this step.
-
Chamber condition
Step 1: 1500 W ICP, 100 W CCP, 40 sccm O2, 40 sccm SF6, 20 degrees C, 15 mT, 30 min. Step 2: 1000 W ICP, 100 W CCP, 7 sccm O2, 21 sccm SF6, 20 degrees C, 15 mT, 30 min. Step 3: Run the exact recipe to be used for 30 min.
-
Sample mounting
Apply a thin layer of Fomblin oil to a 4" Si carrier wafer and place your sample on top. (No oil must be visible.)
-
Strike
Strike plasma at 15 W CCP. As soon as the reflected power starts to decline rapidly, change the power manually to 6 W.
-
Standard etch recipe:
SF6: 45 sccm O2: 21.2 sccm RF power: 6 W ICP power: 1000 W T= -120 °C Helium pressure: 15 torr Chamber pressure: 8 mtorr Etch rate: 27 nm/s Selectivity, Si:PMMA 2.3:1
This recipe is for etching of holes of 70 nm diameter with PMMA as a mask. The PMMA is patterned with EBL beforehand.