Dynamical access of crystal data and optical constants from external servers - radiasoft/sirepo GitHub Wiki
How to access crystal polarizabilities / susceptibilities X0, Xh (chi-zero, chi-h) for x-ray scattering and Bragg diffraction data from http://x-server.gmca.aps.anl.gov/x0h.html
Go to the Beamline page and place a crystal to it.
In the drop-down menu select the Material of the crystal, e.g. Silicon (X0h server) – the following parameters will be changed automatically:
Diffraction plane angle [rad] – is a calculated Bragg angle from the provided energy and d-spacing for the first diffraction peak.
Crystal reflecting planes d-spacing [A] – data is taken directly from the server.
0-th, H-th and -H-th Fourier components of the real and imaginary parts of crystal polarizability are taken from the server as well.
How to access Index of Refraction and X-Ray Attenuation Length from http://henke.lbl.gov/optical_constants for some optical elements (e.g., CRL, fiber, etc.):
In the drop-down menu make sure Method of Getting Delta/Attenuation Length is set to Server http://henke.lbl.gov and change the Material of the CRL to B for the external material, and to W for the core – the following parameters will be updated automatically with the data from the server:
Refractive Index Decrement of Material (closest data value for the specified photon energy is taken).
Attenuation Length [m] (closest data value for the specified photon energy is taken).
