How to cite MAUD - luttero/maud GitHub Wiki

If MAUD was useful for a publication, please cite as follows:

• General use of MAUD: Lutterotti, L. (2000). Maud: a Rietveld analysis program designed for the internet and experiment integration. Acta Crystallogr. Sect. A Found. Crystallogr, 56, s54.
• 2D diffraction analysis: Lutterotti, L., Bortolotti, M., Ischia, G., Lonardelli, I., & Wenk, H. R. (2007). Rietveld texture analysis from diffraction images. Z. Kristallogr. Suppl, 26, 125-130. and/or Lutterotti, L., Vasin, R., & Wenk, H. R. (2014). Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis. Powder Diffraction, 29(1), 76-84. and/or Wenk, H. R., Lutterotti, L., Kaercher, P., Kanitpanyacharoen, W., Miyagi, L., & Vasin, R. (2014). Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and diamond anvil cell experiments. Powder Diffraction, 29(3), 220-232.
• Neutron time-of-flight diffraction analysis: Wenk, H. R., Lutterotti, L., & Vogel, S. C. (2010). Rietveld texture analysis from TOF neutron diffraction data. Powder Diffraction, 25(3), 283-296.
• Thin film diffraction analysis: Lutterotti, L., Chateigner, D., Ferrari, S., & Ricote, J. (2004). Texture, residual stress and structural analysis of thin films using a combined X-ray analysis. Thin Solid Films, 450(1), 34-41.
• Automation with MILK: Savage, D. J., Lutterotti, L., Biwer, C. M., McKerns, M., Bolme, C., Knezevic, M., & Vogel, S. C. (2023). MILK: a Python scripting interface to MAUD for automation of Rietveld analysis. Journal of Applied Crystallography, 56(4).
• Coordinate systems in MAUD: Schmitt, M. M., Savage, D. J., Yeager, J. D., Wenk, H. R., Lutterotti, L., & Vogel, S. C. (2023). Texture measurements on quartz single crystals to validate coordinate systems for neutron time-of-flight texture analysis. Journal of Applied Crystallography, 56(6).