T25 Self Test Options - atmel-maxtouch/mxt-app GitHub Wiki

T25 Self Test commands and arguments

The T25 Self Test object runs self-test routines in the device to find faults in the sense lines and electrodes. The Self Test T25 object runs a series of test sequences.

-t [--test] : Run all self tests.

-t*XX* [--test=*XX*] : Run individual self test specified by the CMD hex value. (if not listed below)

-t01 : run analog power test (typically AVdd and/or XVdd, refer to each protocol guide for details)

-t11 : run pin fault test

-t12 : run pin fault 2 test

-t13 : run AND gate test

-t17 : run signal limit test

-t20 : run gain test

-t21 : run offset fault test